Generic Processes & Materials - Workplan 2020

Version 1.0

 

  • Materials:
  • addition of new materials to the list of UV transparent
    • for very low-energy photoelectric-effect
  • add/update interfaces allowing use NIST parameters for custom element/materials 
  • Geometry Biasing with Importance:
  • Comparison between generic and importance biasing
  • Investigate rare crashes in Geometry-based Importance biasing
  • Implement extension for multiple particle-type biasing. 
  • Differential Cross-section class:
  • Design and implementation of at least an elastic diff. cross-section class to be used in DXTRAN option
  • Make use of this class in some processes
    • In particular the hadron elastic one
  • Generic Biasing:
  • Continue enriching event biasing options:​
    • DXTRAN-like biasing
    • Implicit capture
    • Occurrence biasing of charged particles, with cross-section changing over the step
  • Extend generic biasing scheme for at rest case
  • Statistical test suite to verify correctness of biasing wrt to analog
  • Feasibility studies and prototyping​
    • Investigate use of occurrence biasing to allow continuous density change inside a same volume
      • point-like interactions solved at principle level
      • what about continuous ?
    • Material/isotope biasing
    • Woodcock tracking
  • Large cross-section change (eg : neutrino interaction)
  • Fast Simulation:
  • Continuation of GFlash models revision
  • Modernisation of EM shower parametrisation
    • including automated tuning procedures
  • Investigate possibility of facilitators for machine learning inference
  • Radiotherapy & radioprotection:
  • Completion of the ambient dose equivalent H*(10) topics